www.uhasselt.be
DSpace

Document Server@UHasselt >

Browsing by Author COSEMANS,

Jump to: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
or enter first few letters:   
Sort by: In order: Results/Page Authors/Record:
Showing results 1 to 6 of 6
TitleTypeIssue Date
Dynamics of electromigration induced void/hillock growth and precipitation/dissolution of addition elements studied by in-situ scanning electron microscopy resistance measurements
MICROELECTRONICS RELIABILITY, 39(11). p. 1617-1630
Journal Contribution1999
Electromigration-induced drift in damascene and plasma-etched Al(Cu). I. Kinetics of Cu depletion in polycrystalline interconnects
JOURNAL OF APPLIED PHYSICS, 87(1). p. 86-98
Journal Contribution2000
Microstructurele studie van thermisch- en stroomgedreven processen in A1-gebaseerde on-chip interconnecties m.b.v. elektronenmicroscopie
Theses and Dissertations1999
Stress relaxation in Al-Cu and Al-Si-Cu thin films
JOURNAL OF MATERIALS RESEARCH, 14(4). p. 1246-1254
Journal Contribution1999
Stress relaxation in Al(Cu) thin films
Microelectronic engineering, 33(1-4). p. 137-147
Journal Contribution1997
Study of the microstructure of IC interconnect metallisations using analytical transmission electron microscopy and secondary ion mass spectrometry
MICROELECTRONICS AND RELIABILITY, 36(11-12). p. 1699-1702
Journal Contribution1996
Showing results 1 to 6 of 6