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Browsing by Author ARESU, Stefano

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Showing results 1 to 6 of 6
TitleTypeIssue Date
A new method for the analysis of high-resolution SILC data
MICROELECTRONICS RELIABILITY, 43(9-11). p. 1483-1488
Journal Contribution2003
Evidence for source side injection hot carrier effects on lateral DMOS transistors
MICROELECTRONICS RELIABILITY, 44(9-11). p. 1621-1624
Journal Contribution2004
High-resolution SILC measurements of thin SiO2 ultra low voltages
MICROELECTRONICS RELIABILITY, 42(9-11). p. 1485-1489
Journal Contribution2002
Study of the behaviour of oxide related degradation mechanisms of smart power based transistors
Theses and Dissertations2005
Tuning the dimensions of C-60-based needlelike crystals in blended thin films
ADVANCED FUNCTIONAL MATERIALS, 16(6). p. 760-765
Journal Contribution2006
Understanding Oxide Degradation Mechanisms in ultra-thin SiO2 through High-Speed, High Resolution in-situ Measurements
Microelectronic Engineering, 80(1). p. 182-185
Journal Contribution2005
Showing results 1 to 6 of 6