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Showing results 1 to 12 of 12
TitleTypeIssue Date
Analysis of the operating conditions of ETP electron multipliers used on Cameca IMS instruments
Proceedings of the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS 11, Orlando, Fla, USA, 7-12 September 1997). p. 731-734.
Proceedings Paper1998
Correlation between the OES plasma composition and the diamond film properties during microwave PA-CVD with nitrogen addition
THIN SOLID FILMS, 340(1-2). p. 159-163
Journal Contribution1999
Evaluation of the energy selection optics of Cameca IMS instruments using Fast Fourier Transforms (FFT)
Proceedings of the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS 11, Orlando, Fla, USA, 7-12 September 1997). p. 735-738.
Proceedings Paper1998
Investigation of correlations between parameters defining the state of sputtered particles
Proceedings of the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS 11, Orlando, Fla, USA, 7-12 September 1997). p. 931-934.
Proceedings Paper1998
Investigation of the formation of M-2(+)-molecular ions in sputtering processes
JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY, 10(3). p. 246-253
Journal Contribution1999
Investigation of the formation of sputtered oxide clusters with the Laser Assisted Sputtered Neutral Mass Spectroscopy technique (LASNMS)
SIMS XII: Secondary Ion Mass Spectrsoscopy, Brussels. p. 341-344.
Proceedings Paper2000
Investigation of the formation process of MCs+-molecular ions during sputtering
JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY, 11(7). p. 650-658
Journal Contribution2000
Kwantificatie van hoofdelementen met behulp van moleculaire ionen in secundaire ionen massaspectrometrie
Theses and Dissertations1998
Monte Carlo simulation of the formation of M2+-molecular ions sputtered from metallic materials
Proceedings of the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS 11, Orlando, Fla, USA, 7-12 September 1997). p. 895-898.
Proceedings Paper1998
Monte Carlo simulation of the formation of MCs(+) molecular ions
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 156(1-2). p. 61-66
Journal Contribution1996
Quantitation of major elements with secondary ion mass spectrometry by using M-2(+)-molecular ions
JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY, 9(6). p. 638-642
Journal Contribution1998
Study of the diamond deposition on cemented carbides containing 10% Co with a tungsten intermediate layer
Surface and coatings technology, 74-75(2). p. 819-826
Journal Contribution1995
Showing results 1 to 12 of 12