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TitleTypeIssue Date
A comparison between state-of-the-art 'gilch' and 'sulphinyl' synthesised MDMO-PPV/PCBM bulk hetero-junction solar cells
THIN SOLID FILMS, 403. p. 247-251
Journal Contribution2002
Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices.
MICROELECTRONICS RELIABILITY, 43(9-11). p. 1785-1790
Journal Contribution2003
Advantage of in-situ to ex-situ techniques as reliability tool: aging kinetcs of Imec's MCM-D discrete passive devices
Proceedings of the 14th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF2003), Bordeaux-Arcachon, France, 6-10 October 2003.
Proceedings Paper2003
A high resolution method for measuring hot carrier degradation in matched transistor pairs
Proceedings of the 8th European symposium on reliability of electron devices, failure physics and analysis. p. 1533-1536.
Proceedings Paper1997
A method to minimize test times for accelerated testing of pHEMT's by analysis of the elctronic fingerprint of the initial stage of degradation
Microelectronics and reliability, 40(8-10). p. 1721-1726
Journal Contribution2000
An activation-energy study of the microstructural changes in al-1-percent-si interconnects
JOURNAL OF APPLIED PHYSICS, 75(4). p. 2270-2277
Journal Contribution1994
Analysis of an optical biosensor based on elastic light scattering from diamond-, glass-, and sapphire microspheres
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 209 (9), p. 1804-1810
Journal Contribution2012
A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation
MICROELECTRONICS RELIABILITY, 41(3). p. 437-443
Journal Contribution2001
A NEW EXPLANATION FOR THE LINEAR INCREASE OF VISCOSITY WITH TIME IN AMORPHOUS-ALLOYS
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 133. p. 340-341
Journal Contribution1991
A new method for the analysis of high-resolution SILC data
MICROELECTRONICS RELIABILITY, 43(9-11). p. 1483-1488
Journal Contribution2003
A new method for the lifetime determination of submicron metal interconnects by means of a parallel test structure
2004 24TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, PROCEEDINGS, VOLS 1 AND 2. p. 633-636.
Proceedings Paper2004
A new method for the lifetime determination of submicron metal interconnects by means of a parallel test structure
Microelectronics Reliability, 45(3-4). p. 753-759
Journal Contribution2005
A new precursor to electroconducting conjugated polymers: Synthesis and opto-electrical properties of luminescent devices based on these PPV derivatives
OPTICAL MATERIALS, 9(1-4). p. 150-153
Journal Contribution1998
A new technique to characterize the early stages of electromigration-induced resistance changes at low current densities
MICROELECTRONICS AND RELIABILITY, 36(11-12). p. 1695-1698
Journal Contribution1996
A novel non-destructive method for assessing the thermal resistance of power GaAs RF-MMIC amplifiers
2000 HIGH FREQUENCY POSTGRADUATE STUDENT COLLOQUIUM. p. 20-25.
Proceedings Paper2000
Apparent and steady-state etch rates in thin film etching and under-etching of microstructures: II. Characterization
JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 20(5)
Journal Contribution2010
Apparent and steady-state etch rates in thin film etching and under-etching of microstructures: I. Modelling
JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 20(5)
Journal Contribution2010
A re-interpretation of the existence of a spectrum of activation energies for the microstructural changes in Al 1% Si lines
JOURNAL OF APPLIED PHYSICS, 79(4). p. 2160-2161
Journal Contribution1996
A SIMPLE METHOD FOR CALCULATING AN ENERGY-SPECTRUM FOR DEFECT ANNEALING FROM A CONSTANT HEATING RATE EXPERIMENT
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 66(5). p. 601-613
Journal Contribution1992
A SIMPLE METHOD OF CALCULATING AN ENERGY-SPECTRUM FROM ISOTHERMAL MEASUREMENTS, USING FOURIER TECHNIQUES
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 65(5). p. 1053-1065
Journal Contribution1992
Showing results 1 to 20 of 95